Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang, - Internships Near Me
Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

Journey to Data Quality (The MIT Press) by Lee, Yang W., Pipino, Leo L., Wang,

USD 17.00 USD
SKU: d5yUVbZ5
GTIN: 9780262513357
Condition: Good

Publisher : The MIT Press. Publication Date : Aug 21 2009.

Tags: 0.5 in 11 Oz 2009 240 Pages 6.3 in 8.9 in 9780262513357 English Journey to Data Quality MIT Press Quality Press Textbook Trade Paperback
Categories: Textbooks, Education & Reference

Specifications

ISBN 9780262513357
Publication Name Journey to Data Quality
Publisher MIT Press
Item Length 8.9 in
Publication Year 2009
Type Textbook
Format Trade Paperback
Language English
Item Height 0.5 in
Item Weight 11 Oz
Item Width 6.3 in
Number Of Pages 240 Pages

What stands out about this textbook is the summary of each chapter in bullet form.

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