VLSI Design and Test: 21st International Symposium, VDAT 2017
USD 102.14 USD
New, unread book. Not previously owned.
Specifications
| Return Shipping Will Be Paid By | Buyer |
| All Returns Accepted | Returns Accepted |
| Item Must Be Returned Within | 30 Days |
| Refund Will Be Given As | Money Back |
| Author | BrajeshKumar Kaushik |
| Language | English |
| Book Series | Unknown |
| Bundle Description | Paperback |
| Character | Unknown |
| Edition | 1st ed. 2017 |
| Format | Paperback |
| Item Height | 23.4 |
| Item Length | 4.2 |
| Item Weight | 1.264 |
| Item Width | 15.6 |
| Number Of Pages | 840 |
| Publication Year | 2017 |
| Publisher | Springer |
| Original Language | English |
| Personalisation Instructions | Not Available |
| Subject | Books |
| Type | Textbook |
A nice touch in this textbook is the tear-out reference card for exams.
